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Bendada, E. and Rahmoun, M. and El Hassani, A. and Rais, K. and Elabbassi, A. (2000) Characterization of shrinking device geometries effects in N-channel HEXFETs. Modelling, measurement and control. A, general physics, electronics, electrical engineering, 73 (1-2). pp. 21-27.

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